Brief introduction

SuperView W3white light interferometerIt is a detection instrument used for sub nanometer level measurement of various precision devices and material surfaces. It is an optical detection instrument that uses white light interference technology as the principle, combined with precision Z-direction scanning module, 3D modeling algorithm, etc. to perform non-contact scanning of the device surface and establish surface 3D images. The system software processes and analyzes the 3D images of the device surface, and obtains 2D and 3D parameters reflecting the surface quality of the device, thereby achieving 3D measurement of the device surface morphology.

The SuperView W3 white light interferometer can be widely used in semiconductor manufacturing and packaging process testing, 3C electronic glass screens and their precision accessories, optical processing, micro nano materials and manufacturing, automotive parts, MEMS devices and other ultra precision processing industries, as well as aerospace, defense industry, research institutes and other fields. It can measure the surface of various objects ranging from ultra smooth to rough, low reflectivity to high reflectivity, and the roughness, flatness, micro geometric contour, curvature, etc. of workpieces from nanometer to micrometer levels. It provides more than 300 2D and 3D parameters as evaluation criteria based on the four major domestic and foreign standards of ISO/ASME/EUR/GBT.

2、 Product Features

1. The measurement and analysis software for integrated operation does not require switching interfaces. The configuration parameters are pre-set before measurement, and the software automatically collects measurement data and provides data report export function, which can quickly achieve batch measurement function.

2. Automatic multi area measurement function, batch measurement, automatic focusing, automatic brightness adjustment and other automation functions are provided in the measurement.

3. Provide splicing measurement function during measurement.

4. In the analysis, the data processing functions of four modules are provided, namely, position adjustment, correction, filtering, and extraction. The position adjustment includes image leveling, mirroring, and other functions; Correction includes functions such as spatial filtering, contouring, and peak denoising; Filtering includes functions such as removing external shapes, standard filtering, and filtering spectra; Extraction includes functions such as extracting regions and extracting profiles.

5. The analysis provides five major analysis functions, including roughness analysis, geometric contour analysis, structural analysis, frequency analysis, and functional analysis. Among them, roughness analysis includes full parameter analysis functions based on international standards such as ISO4287 line roughness, ISO25178 surface roughness, ISO12781 flatness, etc; Geometric contour analysis includes measurement of features such as step height, distance, angle, and curvature, as well as evaluation of straightness, roundness, and positional tolerances; Structural analysis includes pore volume and valley depth, etc; Frequency analysis includes functions such as texture direction and spectral analysis; Functional analysis includes functions such as SK parameters and volume parameters.

6. In the analysis, auxiliary analysis functions such as one click analysis and multi file analysis are provided simultaneously. By setting up analysis templates and combining with the automatic measurement and batch measurement functions provided in the measurement, it is possible to achieve batch measurement of small-sized precision components and directly obtain analysis data.

3、 Application Fields

Measure and analyze surface morphology features such as flatness, roughness, waviness, surface contour, surface defects, wear, corrosion, pore gaps, step height, bending deformation, and processing of various products, components, and materials.

Semiconductor manufacturing (thinning roughness, laser channel contour)	Optical components Curvature&Profile Size&Roughness
(Ultra precision) machining Outline dimensions&angles	Surface engineering (tribology) Outline area&volume
3C Electronics (Glass Screen) roughness	Standard block Step height&roughness

4、 Sample Test Report:

Click on the image or text in the table to view detailed report data

Please be advised that due to market development and product development needs, the relevant content in this product information may be updated or modified at any time based on actual circumstances without prior notice. We apologize for any inconvenience caused.